HIT - Holon Institute for Technology, Faculty of Industrial Engineering and Technology Management, invites researchers to submit abstracts for an international conference on Abnormality Detection in Industrial and Infrastructure Systems Using Machine Learning. Hybrid sessions (both virtual and physical) will enable experts worldwide to share ideas and research results.
The purpose of the conference is to bring together researchers, engineers, academic faculty, and practitioners interested in theoretical advances and practical applications in abnormality detection.
* Both sessions will enable remote participation.
Conference Chair: Prof. David Perry
Keynote Speaker: Prof. Oded Maimon
Coordinators: Ms. Ilana Ben-Noon Syskal, Ms. Orly Seligmann, Dr. Eyal Brill, Dr. Arriel Benis
Abstracts should be in English.
Selected abstracts will be invited to contribute to conference book.