Evanescent Optical Method for Evaluating Nanoprofiles of Materials Deposited on Transparent Surfaces

December 31, 2018 [Monday] @ 15:00 Professor Aaron Peled (Holon Institute of Technology) will give a talk on “Evanescent Optical Method for Evaluating Nanoprofiles of Materials Deposited on Transparent Surfaces”.

Abstract

An experimental morphology profile diagnostic differential evanescent light intensity imaging (DELI) method was developed in our photonics laboratory which is an optical microscopy technique based on capturing the optical field obtained from evanescent fields by nano-materials layers deposited on a waveguide such as glass substrates. The technique uses the phenomenon of total internal reflection (TIR) where evanescent waves occur. This technique has the advantage over reflective or transmission microscopy that the propagating electromagnetic field in the waveguide does not interfere with the photons extracted perpendicular to the substrate surface, thus giving an excellent contrast for optical density vs. dark background, enabling nanometer thickness z-profiling by optical microscopy. The DELI technique uses optical density 2D images captured by the microscope camera and then processed by Image Processing techniques to be displayed finally in 1D and 3D perspective images. The technique is much easier and economical to use for nanometer films profiling as compared to SEM and AFM and suited especially for large areas profiling. 

Place: Holon Institute of Technology, Faculty of Sciences, Seminar Room 424/8.
(Light refreshments will be served at 14:45)

Directions: Google Map